1.Field-emission scanning electron microscope, SEM



The JSM-6500F, a field-emission scanning electron microscope, which employs a Schottky type field-emission (T-FE) gun for the electron source and state-of-the-art computer technology for the image-display system, has analytical functions such as EDX and CL, as well as a function for high-resolution image observation. The probe-current range is from several pA to 100 nA. The accerlated voltage is from 0.5 kV to 30 kV, with 1.5 nm (15 kV) spatial resolution. (From JEOL)


2.Cathodoluminescence system, CL





3.Energy dispersive X-ray spectroscopy, EDX







4.Raman-scattering spectroscopy



Raman spectroscopy is a spectroscopic technique based on inelastic scattering of monochromatic light, usually from a laser source. Inelastic scattering means that the frequency of photons in monochromatic light changes upon interaction with a sample. Photons of the laser light are absorbed by the sample and then reemitted. Frequency of the reemitted photons is shifted up or down in comparison with original monochromatic frequency, which is called the Raman effect. This shift provides information about vibrational, rotational and other low frequency transitions in molecules. Raman spectroscopy can be used to study solid, liquid and gaseous samples.





Measurement range: 190 nm – 3300 nm
UV/Vis Resolution: 0.17 – 5.00 nm
NIR Resolution: 0.20 – 20.00 nm
With a 60 mm integrating sphere


6.Thermal evaporator







7.Atomic Force Microscopy



Atomic force microscope (AFM) is a type of scanning probe microscopes (SPM). It is operated by measuring force between a probe and the specimen surfaces. In general, the probe is a sharp tip at a cantilever's end. The cantilever can be deflected by atomic forces to sufficiently large amount, then AFM can measure the vertical and lateral deflections of the cantilever by using the optical system. A laser beam is transmitted to cantilever, and the reflected laser beam is detected with a position-sensitive photo detector (PSPD).  The output of the PSPD is provided to a computer for processing of the data for providing a topographical image of the surface with atomic resolution, and controlling the height between probe and specimen surfaces by applying voltage on piezoelectric scanner.



8.Optical Microscopy





9.Photoluminescence (PL) Measured System

    (325 nm He-Ne Laser
上圖、Grating system下圖)





















10.Electronic Balance












11.High Temperature Furnace





12.Microstat Magneto-optical (MO) System



The Microstat MO is a continuous flow liquid helium cryostat combined with a conduction cooled superconducting magnet. The design allows a sample to be cooled to a low temperature and studied in a magnetic field both optically and electrically simultaneously. The window arrangement allows the sample to be brought close to the objective lens of the microscope with the sample mounted in vacuum and cooled by conduction. A second window in the base of the cryostat enables the possibility of transmission measurements to be performed. (From Oxford Instruments)



13.Auto Fine Coater



This coater, which consists for a main unit and a pump, is intended mainly to preparing specimens for SEM observation.
It coats biological and other nonconductive specimens with metals, efficiently and in a short time. (From JEOL)